Patent · US Active

Calibration validation using geometric features in galvanometric scanning systems

US11525968B2 · kind B2 · utility

0Cited by
2References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 12, 2020
Grant dateDec 13, 2022
Priority date
Expiry dateApr 17, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B26/105
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Some embodiments may include a method of generating assessment data in a system including a galvanometric scanning system (GSS) having a laser device to generate a laser beam and an X-Y scan head module to position the laser beam on a work piece. The method may include selecting a dimension based on a desired accuracy for validation (and/or a characteristic of an imaging system in embodiments that utilize an imaging system). The method may include commanding the GSS to draw a mark based on a polygon or ellipse of the selected dimension around a predetermined target point associated with the work piece to generate assessment data, and following operation of the GSS based on said commanding, validating a calibration of the GSS using the assessment data (or an image thereof in embodiments that utilize an imaging system). Other embodiments may be disclosed and/or claimed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.