Computer system and method for batch data alignment with active learning in batch process modeling, monitoring, and control
US11526155B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2020 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Aug 4, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/32396
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Computer-based methods and systems provide automated batch data alignment for a batch production industrial process. An example embodiment selects a reference batch from batch data for a subject industrial process and configures batch alignment settings. In turn, a seed model configured to predict alignment quality given settings for one or more alignment hyperparameters is constructed. Collectively the selected reference batch, the configured batch alignment settings, the constructed seed model, and a set of representative batches, representative of the batch data for the industrial process, are used to perform at least one of: (i) automated active learning, (ii) interactive active learning, and (iii) guided learning to determine settings for the one or more alignment hyperparameters. Then, a batch alignment is performed using the determined settings for the one or more alignment hyperparameters and the configured batch alignment settings. The resulting aligned batch data of the subject industrial process enables improved modeling and control of batch productions by the subject industrial process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.