Abnormality determination device, learning device, and abnormality determination method
US11526783B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2020 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Jul 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An abnormality determination device includes one or more processors. The processors input first input data to a first model to obtain first output data. The first output data is formed by restoring data with the reduced dimension to data with the same dimension as that of the first input data. The processors input second input data, which is a difference between the first input data and the first output data, to a second model, and obtain second output data. The second output data is formed by restoring data with the reduced dimension to data with the same dimension as that of the second input data. The processors obtain restored data that is a sum of the first output data and the second output data. The processors compare the first input data with the restored data and determine an abnormality in the first input data based on the comparison result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.