Method, device and program for processing diffraction images of a crystalline material
US11526980B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 7, 2018 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Aug 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10061
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E6, E12), a current elastic deformation gradient tensor Fe is given a value determined by calculation, during a second step (E7), the current displacement field induced by the tensor Fe is calculated, during a third step (E8), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E12, E7, E8) are carried out on modified values of the tensor r Fe until a convergence criterion is met in relation to the correction to the current value of Fe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.