Methods and systems for calibrating surface data capture devices
US11527014B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2020 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Mar 10, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20081
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An illustrative scene capture system determines a set of two-dimensional (2D) feature pairs each representing a respective correspondence between particular features depicted in both a first intensity image from a first vantage point and a second intensity image from a second vantage point. Based on the set of 2D feature pairs, the system determines a set of candidate three-dimensional (3D) feature pairs for a first depth image from the first vantage point and a second depth image from the second vantage point. The system selects a subset of selected 3D feature pairs from the set of candidate 3D feature pairs in a manner configured to minimize an error associated with a transformation between the first depth image and the second depth image. Based on the subset of selected 3D feature pairs, the system manages calibration parameters for surface data capture devices that captured the intensity and depth images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.