Interpreting optical signals from tailored arrays of metasurfaces
US11527566B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2020 |
| Grant date | Dec 13, 2022 |
| Priority date | — |
| Expiry date | Aug 20, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/80
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method interpret optical characterization examinations performed with a set of optical devices. Each device comprises one or more arrays of optical metasurface structures and have arrays tailored to have distinct properties making them differ from one another. First data and second data are accessed that capture a physical fingerprint of each device and an outcome of an optical characterization examination performed with each device, respectively. The outcomes of examinations performed are impacted by the respective, distinct properties of the arrays. Each device is identified based on the first data accessed, which makes it possible to obtain a readout key associated with the identified device. This readout key accounts for the respective one of the distinct properties. Finally, the second data are interpreted according to the readout key obtained to elucidate the outcome of the optical characterization examination. The invention is further directed to related computer program products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.