Device and method for monitoring material flow parameters along a passage
US11536597B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2018 |
| Grant date | Dec 27, 2022 |
| Priority date | — |
| Expiry date | Aug 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8592
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein is a device (1) for measuring parameters of a material (3) flowing along a passage (5), the passage having two longitudinally spaced apart ends and transverse sides defined by one or more sidewalls (7, 9). The device (1) includes a laser source (15) positioned at a first location within or adjacent a side of the passage (5) and configured to generate a laser beam (17) at one or more predetermined frequencies. A beam projection element (21, 27) projects the laser beam (17) transversely across the passage (5) to irradiate the material (3) within a measuring zone (19). The measuring zone (19) includes a transverse region extending greater than 50% of the width of the passage (5). An optical imaging device (29) is positioned at a second location within or adjacent the passage (5) and configured to capture images of backscattered light from material (3) within the measuring zone (19). A processor (41) is in communication with the optical imaging device (29) and is configured to process the captured images and perform a scattering analysis to determine parameters of the material (3) through the passage (5).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.