Imaging systems with angled sensors and related methods
US11536655B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2021 |
| Grant date | Dec 27, 2022 |
| Priority date | — |
| Expiry date | Feb 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Diffraction-based imaging systems are described. Aspects of the technology relate to imaging systems having one or more sensors inclined at angles with respect to a sample plane. In some cases, multiple sensors may be used that are, or are not, inclined at angles. The imaging systems may have no optical lenses and are capable of reconstructing microscopic images of large sample areas from diffraction patterns recorded by the one or more sensors. Some embodiments may reduce mechanical complexity of a diffraction-based imaging system. A diffractive imaging system comprises a light source, a sample support configured to hold a sample along a first plane, and a first sensor comprising a plurality of pixels disposed in a second plane that is tilted at an inclined angle relative to the first plane. The first sensor is arranged to record diffraction images of the light source from the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.