Patent · US Active

Method and particle analyzer for measuring a low concentration particle sample

US11536734B2 · kind B2 · utility

0Cited by
3References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 2, 2018
Grant dateDec 27, 2022
Priority date—
Expiry dateOct 28, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2035/00465
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and particle analyzer for measuring a low concentration particles sample disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.