Patent · US Active

Test system and method for signal processing

US11536764B2 · kind B2 · utility

0Cited by

3References

17Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Kevin Guo · Seattle, US
Johann Tost · Munich, DE

Key dates

Filing date	Jul 15, 2020
Grant date	Dec 27, 2022
Priority date	—
Expiry date	Nov 28, 2040

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/0085
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.