Test board having semiconductor devices mounted as devices under test and test system including the test board
US11536766B2 · kind B2 · utility
0Cited by
7References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2019 |
| Grant date | Dec 27, 2022 |
| Priority date | — |
| Expiry date | Sep 24, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2867
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test board includes a board substrate, a connector at a side of the board substrate, a plurality of device-under-test (DUT) boards which are connected to the board substrate and on which semiconductor devices are mounted as DUTs, and a plurality of DC-DC converters connected to the plurality of DUT boards. The plurality of DC-DC converters convert an input voltage supplied thereto via the connector into operating voltages, and provide the operating voltages to the semiconductor devices on the plurality of DUT boards corresponding thereto. The operating voltages are substantially the same.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.