Patent · US Active

Systems and methods for reducing manufacturing failure rates

US11537903B2 · kind B2 · utility

0Cited by
44References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 2019
Grant dateDec 27, 2022
Priority date
Expiry dateMar 13, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.