Patent · US Active

Method for determining errors in parameters derived from digital object representations

US11538144B2 · kind B2 · utility

0Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 14, 2019
Grant dateDec 27, 2022
Priority date
Expiry dateMay 17, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a method for determining errors in at least one parameter of the object derived from a digital representation of an object, wherein the digital representation comprises a large number of pixels arranged on a grid. At least one item of image information that quantifies a material-specific value of the object at the position of the pixel is assigned to a pixel. The image information results from a metrological mapping of the object, and is overlaid with statistical noise. As a result of the metrological mapping of the object, the image information of a first pixel is correlated to the image information of pixels within a surroundings of the first pixel defined by a correlation length of the image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.