Method for determining errors in parameters derived from digital object representations
US11538144B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 14, 2019 |
| Grant date | Dec 27, 2022 |
| Priority date | — |
| Expiry date | May 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method for determining errors in at least one parameter of the object derived from a digital representation of an object, wherein the digital representation comprises a large number of pixels arranged on a grid. At least one item of image information that quantifies a material-specific value of the object at the position of the pixel is assigned to a pixel. The image information results from a metrological mapping of the object, and is overlaid with statistical noise. As a result of the metrological mapping of the object, the image information of a first pixel is correlated to the image information of pixels within a surroundings of the first pixel defined by a correlation length of the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.