Pixel circuit and testing method
US11538375B2 · kind B2 · utility
0Cited by
3References
17Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Nov 26, 2020 |
| Grant date | Dec 27, 2022 |
| Priority date | — |
| Expiry date | Nov 26, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2320/0238
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to a pixel circuit and a testing method of the pixel circuit. The pixel circuit comprises a light emitting element, a storage capacitor Cst, a drive sub-circuit, a reset sub-circuit, a write sub-circuit, a light emission control sub-circuit and a testing element, wherein a control terminal of the testing element is connected to s reset control signal line, a first terminal of the testing element is connected to a reset signal line, a second terminal of the testing element is connected to the drive sub-circuit, and the testing element is configured to test elements included in the pixel circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.