Patent · US Active

Measurement method for geometric errors of numerical control turntable based on four-station laser tracer system

US11543234B2 · kind B2 · utility

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Key dates

Filing dateAug 28, 2020
Grant dateJan 3, 2023
Priority date
Expiry dateMar 4, 2041

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23Q2220/004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring geometric errors of a numerical control turntable based on a four-station laser tracer system includes: establishing a self-calibration coordinate system and calibrating positions of tracking interferometers; respectively placing each of target lenses at three non-coplanar points that are above the numerical control turntable and keep certain distances from the numerical control turntable, controlling the numerical control turntable to rotate at a certain angular interval θj, and based on positions of the tracking interferometers being known after calibration, solving coordinates of each of measurement points in the self-calibration coordinate system using a non-linear least square method; establishing a turntable coordinate system; perform a conversion between the turntable coordinate system and the self-calibration coordinate system; separating six geometric errors of the numerical control turntable using spatial position errors of the three points at a same position and using the linear least squares method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.