Method and system for full-field interference microscopy imaging
US11543641B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2020 |
| Grant date | Jan 3, 2023 |
| Priority date | — |
| Expiry date | Jan 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10101
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.