Computer-generated accurate yield map data using expert filters and spatial outlier detection
US11544247B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 7, 2021 |
| Grant date | Jan 3, 2023 |
| Priority date | — |
| Expiry date | May 7, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q50/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for decontaminating raw yield maps by combining filters with spatial outlier detectors is provided. In an embodiment, the method comprises receiving over a computer network electronic digital data comprising first yield data representing crop yields harvested from an agricultural field; applying one or more filters to the first yield data to identify, from the first yield data, first outlier data; generating first filtered data from the first yield data by removing the first outlier data from the first yield data; identifying, in the first filtered data, second outlier data representing outlier values based on one or more outlier characteristics; generating second outlier data from the first filtered data by removing the second outlier data from the first filtered data; generating and causing displaying on a mobile computing device a graphical representation of the crop yields harvested from the agricultural field using only the second outlier data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.