Inspection device, inspection method, and recording medium
US11544840B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 20, 2020 |
| Grant date | Jan 3, 2023 |
| Priority date | — |
| Expiry date | Dec 1, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An inspection device that inspects eligibility of a subject image, the inspection device including a hardware processor and a recording medium including instructions that when executed by the hardware processor cause the inspection device to: acquire the subject image and a reference image corresponding to the subject image; acquire a judgment criterion indicating a range of eligibility for differences between images; detect a difference between the subject image and the reference image; and when the difference is detected, judge eligibility of the subject image by determining whether or not the difference is included in the range indicated by the judgment criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.