Automated gauge reading and related systems, methods, and devices
US11544916B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 13, 2020 |
| Grant date | Jan 3, 2023 |
| Priority date | — |
| Expiry date | Mar 31, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E30/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Computing devices and methods for reading gauges are disclosed. A gauge reading method includes capturing image data corresponding to a captured image of one or more gauges, detecting one or more gauges in the captured image, cropping a detected gauge in the captured image to provide a use image including the detected gauge, and classifying the detected gauge to correlate the detected gauge with a template image. The gauge reading method also includes attempting to perform feature detection rectification on the use image to produce a rectified image of the detected gauge, performing template matching rectification on the use image to produce the rectified image responsive to a failure to perform the feature detection rectification, and estimating a gauge reading responsive to the rectified image. A computing device may implement at least a portion of a gauge reading method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.