Determination of depositional environments
US11549894B2 · kind B2 · utility
2Cited by
66References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2020 |
| Grant date | Jan 10, 2023 |
| Priority date | — |
| Expiry date | Dec 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods are provided for determining a depositional environment of a sample of a subterranean environment. An example method includes measuring intensities for a crystallographic plane (CP) 100 peak and a CP 101 peak for quartz in a diffractogram, calculating a ratio of the intensities of the CP 100 peak to the CP 101 peak, and identifying a depositional environment for the sample from the ratio.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.