Method and device for conducting measurements for an N-dimensional data structure
US11551041B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2018 |
| Grant date | Jan 10, 2023 |
| Priority date | — |
| Expiry date | Nov 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/764
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for acquiring measurements for a data structure corresponding to an array of variable includes: selecting a subset of elements from the data structure; measuring a sampled value for each of the selected subset of elements; storing each of the sampled values in a K-nearest neighbour (KNN) database and labelling the sampled value as certain; generating a predicted value data structure where each predicted element is generated as the value of its nearest neighbor based on the values stored in the KNN database; for each predicted element: retrieve the predicted element's X nearest neighbours for the sampled value in the KNN database, and when a value of the X nearest neighbours is the same as the predicted element, the predicted element is labelled as certain, otherwise the predicted element is labelled the values as uncertain; and repeating until all elements are labelled as certain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.