Image reconstruction method and device
US11551333B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 17, 2020 |
| Grant date | Jan 10, 2023 |
| Priority date | — |
| Expiry date | Jul 5, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of this application provide an image reconstruction method and device. The method includes: inputting a first image into a newly constructed super-resolution model to obtain a reconstructed second image, where a resolution of the second image is higher than that of the first image. The newly constructed super-resolution model is obtained by training an initial super-resolution model by using an error loss. The error loss includes a pixel mean square error and an image feature mean square error. The image feature in the image feature mean square error includes at least one of a texture feature, a shape feature, a spatial relationship feature, and an image high-level semantic feature. According to the embodiments of this application, the quality of a reconstructed image can be improved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.