Analyzing symmetry in image data
US11551371B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 2019 |
| Grant date | Jan 10, 2023 |
| Priority date | — |
| Expiry date | Sep 17, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing an image to assess a degree of asymmetry in an object having a presumed mirror symmetry includes: retrieving an image of the object; obtaining a mirrored image by flipping along an axis that has an a-priori unknown spatial relation to the presumed plane of symmetry; obtaining a mapping between the retrieved image and the mirrored image; determining a measure of asymmetry in the object by considering element pairs of a first element of the retrieved image and a second element of the mirrored image according to the mapping. Obtaining the mapping comprises performing a rigid registration followed by a non-rigid registration of the retrieved image to the mirrored image. The measure of asymmetry is determined by calculating the Jacobian of the non-rigid deformation in each element of the image. The invention also pertains to a computer program product and an image processing system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.