Image analysis method and related device
US11551438B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 14, 2020 |
| Grant date | Jan 10, 2023 |
| Priority date | — |
| Expiry date | Aug 14, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/172
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An image analysis method and a related device are provided. The method includes: obtaining an input matrix of a network layer A, the input matrix of the network layer A obtained based on a target type image; obtaining a target convolution kernel and a target convolution step length corresponding to the network layer A, different network layers corresponding to different convolution step lengths; performing convolution calculation on the input matrix and the target convolution kernel according to the target convolution step length to obtain an output matrix of the network layer A, the output matrix used for representing a plurality of features included in the target type image; determining a target preset operation corresponding to the target type image according to a pre-stored mapping relationship between a type image and a preset operation; and performing the target preset operation according to the plurality of features comprised included in the target type image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.