Test system and method for autonomous machines
US11554791B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2020 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Jul 18, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/56
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A test system includes a master electronic control module (ECM) configured to receive user input for performing a test action. The master ECM determines one or more subsystem ECMs associated with the requested test action and a sequence of operations to be controlled by the subsystem ECMs to perform the requested test action. The master ECM provides instructions to the subsystem ECMs to perform the operations, along with parameters for those operations. The master ECM may determine whether a test action is appropriate to perform, based on sensor data, before instructing subsystem ECMs to perform the operations of the test action.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.