Patent · US Active

Test system and method for autonomous machines

US11554791B2 · kind B2 · utility

0Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 2020
Grant dateJan 17, 2023
Priority date
Expiry dateJul 18, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/56
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A test system includes a master electronic control module (ECM) configured to receive user input for performing a test action. The master ECM determines one or more subsystem ECMs associated with the requested test action and a sequence of operations to be controlled by the subsystem ECMs to perform the requested test action. The master ECM provides instructions to the subsystem ECMs to perform the operations, along with parameters for those operations. The master ECM may determine whether a test action is appropriate to perform, based on sensor data, before instructing subsystem ECMs to perform the operations of the test action.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.