Optoelectronic measuring device
US11555737B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 24, 2020 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Jan 24, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Herein disclosed is an optoelectronic measuring device. The optoelectronic measuring device comprises an objective lens, an imaging lens, a camera, and an optical path adjusting module which are disposed at the first light path. The objective lens receives a first testing light, and transforms the first testing light into a second testing light. The imaging lens receives the second testing light, and transforms the second testing light into a third testing light. The camera measures a beam characteristic of the third testing light. The optical path adjusting module, disposed between the imaging lens and the camera, comprises a mirror, the mirror moves relatively to the imaging lens according to a test command, and adjusts the distance between the imaging lens and the camera at the first light path to be a first optical distance or a second optical distance. Wherein the mirror reflects the third testing light vertically.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.