Sample analyzer and analyzing method thereof
US11555779B2 · kind B2 · utility
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4Claims
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Key dates
| Filing date | Apr 7, 2020 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Mar 27, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/24455
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure provides a sample analyzer and an analyzing method thereof. The sample analyzer includes a first beam source configured to provide a first energy beam to a sample, a second beam source configured to provide a second energy beam, which is different from the first energy beam, to the sample, a reflected beam sensor disposed between the second beam source and the sample to detect a reflected beam of the second energy beam, which is reflected by one side of the sample, and a transmitted beam sensor disposed adjacent to the other side of the sample to detect a transmitted beam of the second energy beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.