Patent · US Active

Processing metrics data with graph data context analysis

US11556507B2 · kind B2 · utility

0Cited by
2References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 2019
Grant dateJan 17, 2023
Priority date
Expiry dateMay 28, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F16/9024
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, system and computer program product for processing metrics data with graph data context analysis. Graph data representing one or more devices or sensors is stored into a first database, and metrics data generated by the devices or sensors is stored in a second database. The metrics data is then applied to the graph data for the context analysis, wherein the context analysis reflects the relationships of the devices or sensors in the graph data to the metrics data generated by the devices or sensors. The graph data comprises nodes for representing the devices or sensors, edges for representing a topology of the devices or sensors, and properties for storing the metrics data associated with the nodes and edges; and the metrics data comprises time-series data that is logged by the devices and sensors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.