Systems and methods for determining measurements of similarity between various types of data
US11556643B2 · kind B2 · utility
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28Claims
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Key dates
| Filing date | Aug 18, 2021 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Aug 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/762
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided to measure the similarity between a first and second data sample. The method can include creating a plurality of k-mers from the first data sample, each k-mer having a first length; generating a first vector from the plurality of k-mers by processing the plurality of k-mers with a plurality of hash functions; calculating a similarity level between the first and second data sample by comparing the first vector to a second vector, the second vector representing the second data sample; and based on the similarity level, determining a maliciousness level of the first data sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.