Vision inspection system and method of inspecting parts
US11557027B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 20, 2020 |
| Grant date | Jan 17, 2023 |
| Priority date | — |
| Expiry date | Sep 23, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A vision inspection system includes a sorting platform having an upper surface supporting parts for inspection, wherein the parts are configured to be loaded onto the upper surface of the sorting platform in a random orientation. The vision inspection system includes an inspection station including an imaging device. The vision inspection system includes a vision inspection controller receiving images and processing the images based on an image analysis model to determine inspection results for each of the parts. The vision inspection controller has a shape recognition tool configured to recognize the parts in the field of view regardless of the orientation of the parts on the sorting platform. The vision inspection controller has an AI learning module operated to customize and configure the image analysis model based on the images received from the imaging device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.