Yield calculation system, yield map generation system, method of calculating yield for baler, and computer readable storage medium
US11559003B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 4, 2020 |
| Grant date | Jan 24, 2023 |
| Priority date | — |
| Expiry date | Mar 19, 2041 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA01F2015/0891
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A yield calculation system comprises a position sensor configured to detect a position. A baler comprises a bale chamber in which crop material is to be formed into a bale, a volume measurement sensor provided in the bale chamber and configured to measure a volume of the bale in the bale chamber, the volume corresponding to the position detected by the position sensor, and a moisture measurement sensor provided in the bale chamber and configured to measure a moisture amount in the bale, the moisture amount corresponding to the position detected by the position sensor. Circuitry is configured to calculate, based on the volume of the bale and the moisture amount corresponding to the position, a yield corresponding to the position by excluding the moisture amount from an amount of the bale.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.