Focusing linear model correction and linear model correction for multivariate calibration model maintenance
US11561166B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2021 |
| Grant date | Jan 24, 2023 |
| Priority date | — |
| Expiry date | Apr 23, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12784
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device may obtain a master beta coefficient of a master calibration model associated with a master instrument. The master beta coefficient may be at a grid of a target instrument. The device may perform constrained optimization of an objective function, in accordance with a set of constraints, in order to determine a pair of transferred beta coefficients. The constrained optimization may be performed based on an initial pair of transferred beta coefficients, the master beta coefficient, and spectra associated with a scouting set. The device may determine, based on the pair of transferred beta coefficients, a transferred beta coefficient. The device may determine a final transferred beta coefficient based on a set of transferred beta coefficients including the transferred beta coefficient. The final transferred beta coefficient may be associated with generating a transferred calibration model, corresponding to the master calibration model, for use by the target instrument.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.