System and method for set up of production line inspection
US11562480B2 · kind B2 · utility
3Cited by
1References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2018 |
| Grant date | Jan 24, 2023 |
| Priority date | — |
| Expiry date | Dec 30, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides an automatic inspection process for detecting visible defects on a manufactured item. The process includes a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected. Images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.