Systems and methods to reduce scattering in temporal focusing multiphoton microscopy
US11562584B2 · kind B2 · utility
1Cited by
4References
42Claims
0Family size
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Key dates
| Filing date | Apr 9, 2020 |
| Grant date | Jan 24, 2023 |
| Priority date | — |
| Expiry date | Nov 9, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2207/114
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods herein provide improved, high-throughput multiphoton imaging of thick samples with reduced emission scattering. The systems and methods use structured illumination to modify the excitation light. A reconstruction process can be applied to the resulting images to recover image information free of scattering. The disclosed systems and methods provide high throughput, high signal-to-noise ratio, and high resolution images that are depth selective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.