System and method for configuring an inspection robot for inspecting an inspection surface
US11565417B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 2020 |
| Grant date | Jan 31, 2023 |
| Priority date | — |
| Expiry date | Aug 29, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05D1/0038
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for configuring a robot for inspecting an inspection surface are disclosed. An example system may include an inspection robot having a payload coupled to at least two inspection sensors and a controller. The controller may include a route profile processing circuit to interpret route profile data for the inspection robot, a configuration determining circuit to determine one or more configurations for the inspection robot in response to the route profile data; and a configuration processing circuit to provide configuration data in response to the determined one or more configurations, the configuration data defining, at least in part, one or more inspection characteristics for the inspection robot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.