Patent · US Active

Measurement apparatus and measurement method

US11567106B2 · kind B2 · utility

1Cited by

2References

18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Gerd Bresser · Munich, DE
Friedrich Reich · Leverkusen, DE

Key dates

Filing date	Aug 1, 2018
Grant date	Jan 31, 2023
Priority date	—
Expiry date	Jun 10, 2040

Classification

Technology area (CPC G)Physics
CPC primaryG06F3/14
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Measurement apparatus and method for digital data acquisition. A first operation mode is provided for real-time processing of digital data having a reduced sample rate or resolution. Furthermore, a second operation mode is provided for processing the measurement signal off-line with a higher accuracy. In particular, the high accuracy data may be temporarily stored and analyzed upon the operation mode is changed from the real-time mode to the off-line mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.