Deep feature extraction and training tools and associated methods
US11568176B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2021 |
| Grant date | Jan 31, 2023 |
| Priority date | — |
| Expiry date | Jun 25, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Deep feature extraction and training tools and processes may facilitate extraction and understanding of deep features utilized by deep learning models. For example, imaging data may be tessellated and masked to generate a plurality of masked images. The masked images may be processed by a deep learning model to generate a plurality of masked outputs. The masked outputs may be aggregated for each cell of the tessellated image and compared to an original output for the imaging data from the deep learning model. Individual cells and associated image regions having masked outputs that correspond to the original output may comprise deep features utilized by the deep learning model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.