Analyzing apparatus, analysis method and analysis program
US11568213B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2019 |
| Grant date | Jan 31, 2023 |
| Priority date | — |
| Expiry date | Aug 19, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The analyzing apparatus: generates first internal data; converts a position of first feature data in a feature space, based on the first internal data and a second learning parameter; reallocates, based on a result of first conversion and the first feature data, the first feature data to a position obtained through the conversion in the feature space; calculates a predicted value of a hazard function of analysis time in a case where the first feature data is given, based on a result of reallocation and a third learning parameter; optimizes the first to third learning parameters, based on a response variable and a first predicted value; generates second internal data, based on second feature data and the optimized first learning parameter; converts a position of the second feature data in the feature space, based on the second internal data and the optimized second learning parameter; and calculates importance data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.