Patent · US Active

Mitigating adversarial effects in machine learning systems

US11568282B2 · kind B2 · utility

1Cited by
0References
20Claims
0Family size

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Inventors

Key dates

Filing dateDec 4, 2019
Grant dateJan 31, 2023
Priority date
Expiry dateMay 20, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Techniques for sanitization of machine learning (ML) models are provided. A first ML model is received, along with clean training data. A path is trained between the first ML model and a second ML model using the clean training data. A sanitized ML model is generated based on at least one point on the trained path. One or more ML functionalities are then facilitated using the sanitized ML model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.