Patent · US Active

Enhanced guided wave thermography inspection systems and methods of using the same

US11573192B2 · kind B2 · utility

0Cited by
7References
14Claims
0Family size

Assignees

Inventors

Key dates

Filing dateAug 1, 2017
Grant dateFeb 7, 2023
Priority date
Expiry dateJul 30, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/0422
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Non-destructive inspection systems (10) and methods for inspecting structural flaws that may be in a structure (15) based on guided wave thermography. The method may include sweeping a frequency-phase space to maximize ultrasonic energy distribution across the structure while minimizing input energy, e.g., via a plurality of actuators. The system may include transducer elements (12, 14, 16, 17) configured to predominantly generate shear horizontal-type guided waves in the structure to maximize thermal response from any flaws.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.