Enhanced guided wave thermography inspection systems and methods of using the same
US11573192B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 1, 2017 |
| Grant date | Feb 7, 2023 |
| Priority date | — |
| Expiry date | Jul 30, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0422
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Non-destructive inspection systems (10) and methods for inspecting structural flaws that may be in a structure (15) based on guided wave thermography. The method may include sweeping a frequency-phase space to maximize ultrasonic energy distribution across the structure while minimizing input energy, e.g., via a plurality of actuators. The system may include transducer elements (12, 14, 16, 17) configured to predominantly generate shear horizontal-type guided waves in the structure to maximize thermal response from any flaws.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.