Physical device inspection or repair
US11574182B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2019 |
| Grant date | Feb 7, 2023 |
| Priority date | — |
| Expiry date | Aug 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/45199
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In certain embodiments, device inspection or repair may be facilitated via signal-based determinations. In some embodiments, one or more flaws may be detected on a portion of a device via an optical sensor. Based on the detection, a physical structure may be caused to physically interact with the portion of the user device. Information indicating signals from the physical interaction may be obtained. Based on the signal information, a determination of whether a repair process should be performed on the device may be effectuated. The device may be assigned to be repaired via the repair process based on the determination indicating that the repair process should be performed on the device. In some embodiments, the signal information may be provided to a prediction model to determine whether the repair process should be performed on the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.