System and method for automated visual inspection
US11574400B2 · kind B2 · utility
0Cited by
3References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 2, 2019 |
| Grant date | Feb 7, 2023 |
| Priority date | — |
| Expiry date | Nov 18, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/3251
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and system for automated visual inspection, include receiving, from a camera imaging an inspection line, an image of the inspection line. The image includes an item on the inspection line personal or confidential image data. A processor produces from the image of the inspection line a reduced image, which does not include the personal or confidential image data, and inputs the reduced image to an inspection process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.