Quality inspection of laser material processing
US11577341B2 · kind B2 · utility
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4References
20Claims
0Family size
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Key dates
| Filing date | May 11, 2020 |
| Grant date | Feb 14, 2023 |
| Priority date | — |
| Expiry date | May 28, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for quality inspection of laser material processing includes performing laser material processing on a workpiece and generating, by a sensor, raw image data of secondary emissions during the laser material processing of the workpiece. The method also includes determining a quality of the laser material processing by analyzing the raw image data of the secondary emissions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.