Patent · US Active

Testing method for non-invasive temperature measuring instruments

US11579026B2 · kind B2 · utility

0Cited by

8References

10Claims

0Family size

Assignee

ABB Schweiz AG · CH

Inventors

Andreas Decker · Besigheim, DE
Joerg Gebhardt · Mainz, DE
Peter Ude · Hanau, DE
Juergen Horstkotte · Enger, DE
Wilhelm Daake · Petershagen, DE

Key dates

Filing date	Nov 19, 2021
Grant date	Feb 14, 2023
Priority date	—
Expiry date	Nov 19, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01K15/005
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a temperature measuring instrument is presented, where the instrument includes at least one sensor that changes its electrical resistance, and/or an electrical voltage that it produces, in response to being exposed to a change in temperature, and where the instrument is configured to be coupled to an object of interest. The method includes changing the temperature of at least one sensor by an amount that is detectable given the measurement resolution of the at least one sensor, by driving an electrical manipulation current through this sensor; obtaining one or measurement values from at least one sensor; and evaluating a state of the measuring instrument, a state of one or more of its sensors, and/or a state of a coupling to an object of interest, from the one or more measurement values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.