Patent · US Active

System, method and apparatus for accurately measuring haptic forces

US11579696B2 · kind B2 · utility

1Cited by
11References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 21, 2020
Grant dateFeb 14, 2023
Priority date
Expiry dateSep 21, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L5/22
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A low-cost sensor and apparatus comprising same, and a system for measuring force, comprising an end-effector having a first end and a second end on opposing sides of the end-effector; a first sensor located at the first end of the end-effector; and a second sensor located at the second end of the end-effector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.