Patent · US Active

Printed image inspection method with defect classification

US11580630B2 · kind B2 · utility

0Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 2021
Grant dateFeb 14, 2023
Priority date
Expiry dateAug 15, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30144
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of inspecting images on printed products by a computer in a printing machine. Printed products are recorded and digitized by an image sensor of an image inspection system in the course of the image inspection process, and the computer compares them to a digital reference image. If deviations are found, the defective printed products are removed. The computer analyzes the deviations found in the course of the image inspection process together with further data from other system parts and from the machine, determines specific defect classes and the causes thereof based on the defects by machine learning processes, assigns the defects found in the image inspection process to the defect classes in a corresponding way, and displays the classified detected defects with their defect classes and causes to an operator of the machine so that the operator can initiate specific measures to eliminate the defect causes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.