Measurement method of subcell photocurrents and their matching degree of a multi-junction photovoltaic cell
US11581849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2021 |
| Grant date | Feb 14, 2023 |
| Priority date | — |
| Expiry date | May 28, 2041 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/50
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A measurement method of subcell photocurrents and a matching degree of the subcell photocurrents of a multi-junction photovoltaic cell is provided. The measurement method includes measuring an I-V characteristic of the multi-junction photovoltaic cell; and measuring currents corresponding to respective current steps in an I-V curve to obtain approximate values of short-circuit currents of subcells in the multi-junction photovoltaic cell, and then calculating a mismatching degree of the multi-junction photovoltaic cell using step currents. According to the measurement method, a current mismatching degree of the multi-junction photovoltaic cell is obtained by calculating the mismatching degree of the step currents occurring in the I-V curve. The measurement method is rapid and simple, the measurement method avoids complicated and time-consuming processes where the subcell photocurrents are calculated based on a standard light source spectrum integral with bias lights applied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.