Inspection system for manufactured components
US11585746B2 · kind B2 · utility
0Cited by
3References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2021 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Jul 19, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.