Non-uniformity correction of photodetector arrays
US11585910B1 · kind B1 · utility
1Cited by
136References
29Claims
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Key dates
| Filing date | Aug 13, 2021 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Nov 11, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for nonuniformity correction (NUC) for a sensor having an avalanche photodiode (APD) array and an integrated circuit. The sensor can include anode bias control module, a passive mode module, and an active mode module. DC photocurrent from the APD array can be measured and used for controlling an anode reverse bias voltage to each element in the APD to achieve a nonuniformity correction level less than a selected threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.