Method for quantitatively identifying the defects of large-size composite material based on infrared image sequence
US11587250B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2021 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Oct 16, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method for quantitatively identifying the defects of large-size composite material based on infrared image sequence, firstly obtaining the overlap area of an infrared splicing image, and dividing the infrared splicing image into three parts according to overlap area: overlap area, reference image area and registration image area, then extracting the defect areas from the infrared splicing image to obtain P defect areas, then obtaining the conversion coordinates of pixels of defect areas according to the three parts of the infrared splicing image, and further obtaining the transient thermal response curves of centroid coordinate and edge point coordinates, finding out the thermal diffusion points from the edge points of defect areas according to a created weight sequence and dynamic distance threshold εttr×dp_max, finally, based on the thermal diffusion points, the accurate identification of quantitative size of defects are completed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.